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contributor authorBérengère Podvin
contributor authorJulien Jouanguy
contributor authorJ.-P. Laval
contributor authorYann Fraigneau
date accessioned2017-05-09T00:38:18Z
date available2017-05-09T00:38:18Z
date copyrightApril, 2010
date issued2010
identifier issn0098-2202
identifier otherJFEGA4-27414#041202_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/143511
description abstractWe use proper orthogonal decomposition (POD) to estimate the flow in the near-wall region based on information from the outer buffer layer. Our goal is to assess how the flow structures in the inner wall region are connected to those further away from the wall, and to investigate the nature of the coupling between the inner and the outer region in the POD framework. Reconstructions are carried out for numerical simulations of a plane channel flow at two different Reynolds numbers. We show that elongated structures with a spanwise wavelength smaller than a critical value tend to be concentrated in the inner layer. The critical wavelength is shown to scale with the inner layer height, and interactions between the inner and the outer layer appear to take place predominantly over a self-similar, height-dependent, range of wavenumbers, in agreement with Townsend’s attached eddy hypothesis. The reconstructed field appears to capture an adequate energy content and to remain correlated with the real field even close to the wall, which reflects the persistence of energetic structures over the extent of the buffer layer.
publisherThe American Society of Mechanical Engineers (ASME)
titleOn Self-Similarity in the Inner Wall Layer of a Turbulent Channel Flow
typeJournal Paper
journal volume132
journal issue4
journal titleJournal of Fluids Engineering
identifier doi10.1115/1.4001385
journal fristpage41202
identifier eissn1528-901X
keywordsFlow (Dynamics)
keywordsTurbulence
keywordsReynolds number
keywordsChannel flow
keywordsEigenfunctions
keywordsEddies (Fluid dynamics)
keywordsComputer simulation AND Polishing equipment
treeJournal of Fluids Engineering:;2010:;volume( 132 ):;issue: 004
contenttypeFulltext


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