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contributor authorD. Bhate
contributor authorL. Nguyen
contributor authorJ. Zhao
contributor authorD. Edwards
contributor authorD. Chan
contributor authorG. Subbarayan
date accessioned2017-05-09T00:37:14Z
date available2017-05-09T00:37:14Z
date copyrightJune, 2010
date issued2010
identifier issn1528-9044
identifier otherJEPAE4-26304#021007_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/142962
description abstractIn this study, we focus on investigating the nature of the stress and strain behavior in solder joints and their effect on the hybrid damage modeling approach, which is inspired by cohesive zone modeling and Weibull functions [, , 2005, “A Hybrid Model for Computationally Efficient Fatigue Fracture Simulations at Microelectronic Assembly Interfaces,” Int. J. Solids Struct., 42(15), pp. 4468–4483]. We review well understood principles in elastic-plastic fracture mechanics and more recent work in cohesive zone modeling, that address the nature of the singular solutions at the crack tip and provide insight when dealing with the more complex problem of solder joint fracture. Using three-dimensional finite element analysis of a chip scale package, we systematically examine the stress-strain behavior at the edge of the solder joint along the interface. The singular nature of the behavior manifests itself as mesh dependence of the predicted crack front shape and the cycles to failure. We discuss the conditions under which the predicted crack growth rate is of reasonable accuracy by incorporating a characteristic length measure. We validate predictions made by the hybrid damage modeling approach against a companion experimental study in which crack growth was tracked in packages subjected to accelerated thermal cycling.
publisherThe American Society of Mechanical Engineers (ASME)
titleSingularities at Solder Joint Interfaces and Their Effects on Fracture Models
typeJournal Paper
journal volume132
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.4001588
journal fristpage21007
identifier eissn1043-7398
keywordsStress
keywordsFracture (Materials)
keywordsSolder joints
keywordsFinite element analysis
keywordsFracture (Process) AND Failure
treeJournal of Electronic Packaging:;2010:;volume( 132 ):;issue: 002
contenttypeFulltext


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