Show simple item record

contributor authorDavid M. Pierce
contributor authorArlo F. Fossum
contributor authorPaul T. Vianco
contributor authorSheri D. Sheppard
contributor authorMike K. Neilsen
date accessioned2017-05-09T00:27:37Z
date available2017-05-09T00:27:37Z
date copyrightMarch, 2008
date issued2008
identifier issn1528-9044
identifier otherJEPAE4-26283#011002_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/137780
description abstractA unified creep plasticity damage (UCPD) constitutive model was developed to predict the fatigue of 95.5Sn–3.9Ag–0.6Cu solder joints. Compression, stress-strain and creep properties were generated in previous studies of this solder. Crack damage was reflected in a single state variable, Dω, in the model. Isothermal fatigue tests were performed at 25°C, 100°C, and 160°C using a double-lap shear test specimen. A new approach to fitting the revised damage model is proposed based on finite element analysis (FEA) simulation of the load decay of the fatigued solder material. Accurate predictions required that those parameters be temperature dependent. The UCPD constitutive model was successfully implemented as a subroutine in the commercial finite element code ANSYS ®. Consistent predictions were obtained as demonstrated by a comparison of results generated from FEA simulation of the test assembly against analogous experimental results.
publisherThe American Society of Mechanical Engineers (ASME)
titleDevelopment of the Damage State Variable for a Unified Creep Plasticity Damage Constitutive Model of the 95.5Sn–3.9Ag–0.6Cu Lead-Free Solder
typeJournal Paper
journal volume130
journal issue1
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2837513
journal fristpage11002
identifier eissn1043-7398
keywordsSimulation
keywordsStress
keywordsShear (Mechanics)
keywordsConstitutive equations
keywordsFinite element analysis
keywordsTesting
keywordsPlasticity
keywordsCreep
keywordsFatigue
keywordsTemperature
keywordsAlloys
keywordsSolders
keywordsSolder joints
keywordsManufacturing
keywordsFatigue testing
keywordsLead-free solders AND Fittings
treeJournal of Electronic Packaging:;2008:;volume( 130 ):;issue: 001
contenttypeFulltext


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record