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contributor authorJ. Liang
contributor authorN. Dariavach
contributor authorD. Shangguan
contributor authorP. Callahan
date accessioned2017-05-09T00:23:24Z
date available2017-05-09T00:23:24Z
date copyrightJune, 2007
date issued2007
identifier issn1528-9044
identifier otherJEPAE4-26275#195_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/135573
description abstractFundamental study of deformation and fatigue fracture behavior of solder alloys under complex load conditions is a key to enabling implementation of sophisticated three-dimensional (3D) time-dependent nonlinear finite-element stress and strain analyses for the life assessment for electronic packages and assemblies. In this study, the rate-dependent deformation and fatigue fracture behavior of Sn3.8Ag0.7CuPb-free alloy and Sn–Pb eutectic alloy was investigated with thin-walled specimens using a biaxial servo-controlled tension–torsion material testing system, with solder alloys subjected to a variety of complex load conditions: pure shearing at strain rates between 6.7×10−7∕s and 1.3×10−1∕s, creep at temperatures ranging from room temperature up to 125°C, and cyclic loading with frequencies of 0.001Hz to 3Hz. Biaxial stress conditions were imposed to investigate the effects of multiaxial stresses on deformation behavior. The effects of frequency and temperature on cyclic deformation and fatigue facture were investigated for lead-free Sn3.8Ag0.7Cu and Sn–Pb eutectic solder. Fractography of fatigue tested samples was also conducted to determine possible fatigue failure mechanisms.
publisherThe American Society of Mechanical Engineers (ASME)
titleInelastic Deformation and Fatigue of Solder Alloys Under Complicated Load Conditions
typeJournal Paper
journal volume129
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2721593
journal fristpage195
journal lastpage204
identifier eissn1043-7398
keywordsTemperature
keywordsAlloys
keywordsSolders
keywordsStress
keywordsShear (Mechanics)
keywordsEutectic alloys
keywordsShearing
keywordsDeformation
keywordsCreep AND Fatigue
treeJournal of Electronic Packaging:;2007:;volume( 129 ):;issue: 002
contenttypeFulltext


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