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contributor authorY. Kim
contributor authorM. J. Pechersky
contributor authorM. J. Morgan
contributor authorY. J. Chao
date accessioned2017-05-09T00:14:08Z
date available2017-05-09T00:14:08Z
date copyrightAugust, 2004
date issued2004
identifier issn0094-9930
identifier otherJPVTAS-28442#293_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/130675
description abstractElastic-plastic crack front fields in arc-shaped tension specimens (C-specimens) were analyzed by a three-dimensional finite element method. The effect of side grooves on the ductile fracture behavior was investigated by studying the J-integral distribution, plane-strain constraint parameter, and development of plastic zones and comparing to experimental data. The applicability of the η factor (derived for use with compact tension specimens) for the calculation of J-integral values for the C-specimen was also investigated. The results show that side grooves promote and establish near plane strain conditions at the crack front in sub-size specimens. It was also found that a two-dimensional plane-strain analysis in conjunction with the standard American Society for Testing and Materials (ASTM) tests was sufficient to determine the fracture toughness values from side-grooved C-specimen. The results indicate the η factor for compact tension specimen as specified in the ASTM standards appears to produce reliable results for the calculation of J of C-specimens.
publisherThe American Society of Mechanical Engineers (ASME)
titleC-Specimen Fracture Toughness Testing: Effect of Side Grooves and η Factor
typeJournal Paper
journal volume126
journal issue3
journal titleJournal of Pressure Vessel Technology
identifier doi10.1115/1.1762425
journal fristpage293
journal lastpage299
identifier eissn1528-8978
keywordsStress
keywordsFracture (Materials)
keywordsFinite element analysis
keywordsTesting
keywordsFracture toughness
keywordsPlane strain
keywordsTension
keywordsASTM International
keywordsThickness AND Fracture (Process)
treeJournal of Pressure Vessel Technology:;2004:;volume( 126 ):;issue: 003
contenttypeFulltext


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