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contributor authorTerrace B. Thompson
contributor authorGanesh Subbarayan
date accessioned2017-05-09T00:04:37Z
date available2017-05-09T00:04:37Z
date copyrightJune, 2001
date issued2001
identifier issn1528-9044
identifier otherJEPAE4-26192#132_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/125051
description abstractThe goals of the present paper are to apply the recently developed decomposed analysis procedure using a computer code developed in this study. The decomposed technique enables one to determine the equilibrium configuration of electronic packages with significant computational efficiency at a reasonable accuracy. Further, it allows the independent analysis of the subsystems enabling “reusable” modules in a manner analogous to the object-oriented programming paradigm of modern computer languages. The code described here uses a nonlinear optimization procedure that ensures the approximate satisfaction of the balance of mechanical energy. The developed procedure is demonstrated on a variety of two- and three-dimensional hypothetical and “real-world” electronic packages. It is shown that with the use of the decomposed solution methodology, for a 225 I/O PBGA package, a speedup of nearly seven times is achieved at an accuracy loss in displacements of approximately 5.5 percent. It is also shown that the calculated peak shear displacements agree very well with experimental measurements made using laser moiré interferometry. Since the analysis procedure is independent of the number of solder interconnects, significantly larger time savings are expected for larger packages.
publisherThe American Society of Mechanical Engineers (ASME)
titleApplications of a Decomposed Analysis Procedure for Area-Array Packages
typeJournal Paper
journal volume123
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.1339197
journal fristpage132
journal lastpage140
identifier eissn1043-7398
keywordsSolders
keywordsShear (Mechanics)
keywordsPhase interfaces
keywordsFinite element analysis
keywordsDisplacement
keywordsErrors
keywordsSolder joints
keywordsOptimization AND Regression models
treeJournal of Electronic Packaging:;2001:;volume( 123 ):;issue: 002
contenttypeFulltext


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