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contributor authorT. Fukuoka
contributor authorT. Takaki
date accessioned2017-05-08T23:57:38Z
date available2017-05-08T23:57:38Z
date copyrightAugust, 1998
date issued1998
identifier issn0094-9930
identifier otherJPVTAS-28385#226_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/121010
description abstractIn a bolted joint, failures usually initiate at the first root of the bolt thread. However, rupture around the bolt head is sometimes reported for a tap bolt because of high stresses produced by tightening torque applied to the bolt head. It is also well known that manufacturing errors of internal threads in a tapped hole are generally much larger than those of external threads, thus leading to the failures concerned. In this paper, mechanical behaviors of bolted joints in various clamping configurations are analyzed using FEM as multi-body elastic contact problem, and the effects of nominal diameter, friction and pitch error upon stress concentrations are evaluated for through bolts, studs, and tap bolts. It is then quantitatively estimated on the effectiveness of “recessed internal threads” for reducing the stress concentration occurred around the far end of bolt hole. In addition, the tightening process and strength of a bottoming stud, which have seldom been studied despite favorable performance in preventing stress concentration at the runout of threads, are also investigated.
publisherThe American Society of Mechanical Engineers (ASME)
titleMechanical Behaviors of Bolted Joint in Various Clamping Configurations
typeJournal Paper
journal volume120
journal issue3
journal titleJournal of Pressure Vessel Technology
identifier doi10.1115/1.2842050
journal fristpage226
journal lastpage231
identifier eissn1528-8978
keywordsMechanical behavior
keywordsThread
keywordsErrors
keywordsFailure
keywordsStress
keywordsStress concentration
keywordsFinite element model
keywordsRupture
keywordsFinite element methods
keywordsBolted joints
keywordsTorque
keywordsFriction AND Manufacturing
treeJournal of Pressure Vessel Technology:;1998:;volume( 120 ):;issue: 003
contenttypeFulltext


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