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contributor authorL. Löfdahl
contributor authorE. Kälvesten
contributor authorG. Stemme
date accessioned2017-05-08T23:50:32Z
date available2017-05-08T23:50:32Z
date copyrightSeptember, 1996
date issued1996
identifier issn0098-2202
identifier otherJFEGA4-27108#457_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/117140
description abstractSilicon based pressure sensors have been used to measure turbulent wall-pressure fluctuations in a two-dimensional flat plate boundary layer, Reθ = 5072. The side lengths of the diaphragms were 100 μm (d+ = 7.2) and 300 μm (d+ = 21.6), giving a ratio of the boundary layer thickness to the diaphragm side length of the order of 240 and a resolution of eddies with wave numbers less than ten viscous units. Power spectra were measured for the frequency range 13 Hz < f < 13 kHz. Scaled in outer and inner variables a clear overlap region between the mid and high frequency parts of the spectrum is shown. In this overlap region the slope was found to be ω−1 , while in the high frequency part it was ω−5 . Correlation measurements in both the longitudinal and transversal directions were performed and compared to other investigations. Longitudinal space time correlations, including the high frequency range, indicated an advection velocity of the order of half the freestream velocity. A broad band filtering of the longitudinal correlation showed that the high frequency part of the spectrum is associated with the smaller eddies from the inner part of the boundary layer, resulting in a reduction of the correlation.
publisherThe American Society of Mechanical Engineers (ASME)
titleSmall Silicon Pressure Transducers for Space-Time Correlation Measurements in a Flat Plate Boundary Layer
typeJournal Paper
journal volume118
journal issue3
journal titleJournal of Fluids Engineering
identifier doi10.1115/1.2817780
journal fristpage457
journal lastpage463
identifier eissn1528-901X
keywordsMeasurement
keywordsSpacetime
keywordsPressure transducers
keywordsBoundary layers
keywordsFlat plates
keywordsSilicon
keywordsSpectra (Spectroscopy)
keywordsDiaphragms (Structural)
keywordsEddies (Fluid dynamics)
keywordsPressure
keywordsThickness
keywordsPressure sensors
keywordsWaves
keywordsFluctuations (Physics)
keywordsResolution (Optics)
keywordsFiltration AND Turbulence
treeJournal of Fluids Engineering:;1996:;volume( 118 ):;issue: 003
contenttypeFulltext


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