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contributor authorDaping Yao
contributor authorZ. Zhang
contributor authorJ. K. Shang
date accessioned2017-05-08T23:49:49Z
date available2017-05-08T23:49:49Z
date copyrightJune, 1996
date issued1996
identifier issn1528-9044
identifier otherJEPAE4-26154#45_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/116785
description abstractFailures of solder joints often result from development of cracks under complex mixed-mode loading conditions. In this study, a flexural peel technique was developed to investigate the growth of cracks at the interface between solder and Cu substrate. The technique was based on a tri-layer solder/Cu joints, with the solder layer sand-wiched between two Cu layers of desired thicknesses. Finite element analysis was used to calculate the mixed-mode condition at the crack tip as a function of the thicknesses of Cu outerlayers and the solder interlayer. The application of this technique to studying interface crack growth under fatigue loading is demonstrated for eutectic solder joints.
publisherThe American Society of Mechanical Engineers (ASME)
titleAn Experimental Technique for Studying Mixed-Mode Fatigue Crack Growth in Solder Joints
typeJournal Paper
journal volume118
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792130
journal fristpage45
journal lastpage48
identifier eissn1043-7398
keywordsFatigue cracks
keywordsSolder joints
keywordsSolders
keywordsFracture (Materials)
keywordsFinite element analysis
keywordsFailure
keywordsFatigue AND Sands
treeJournal of Electronic Packaging:;1996:;volume( 118 ):;issue: 002
contenttypeFulltext


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