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contributor authorZ. Zhang
contributor authorDaping Yao
contributor authorJ. K. Shang
date accessioned2017-05-08T23:49:49Z
date available2017-05-08T23:49:49Z
date copyrightJune, 1996
date issued1996
identifier issn1528-9044
identifier otherJEPAE4-26154#41_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/116784
description abstractA backface strain technique is introduced to examine fatigue crack initiation in solder lap joints. The technique detects the fatigue crack initiation by monitoring the backface strain at the end of the overlap. Variation of the backface strain with the development of a crack was simulated by finite element method. The simulation indicated that the backface strain at the end of the overlap reached a peak value when a fatigue crack initiated. Experimental verification was carried out in 63Sn-37Pb solder joints. The backface strain was recorded as a function of stress cycle to demonstrate the applicability of this technique. Experimental results showed that fatigue crack initiation took about half of the fatigue lifetime of the solder joints.
publisherThe American Society of Mechanical Engineers (ASME)
titleFatigue Crack Initiation in Solder Joints
typeJournal Paper
journal volume118
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792129
journal fristpage41
journal lastpage44
identifier eissn1043-7398
keywordsFatigue cracks
keywordsSolder joints
keywordsFatigue
keywordsSolders
keywordsSimulation
keywordsStress
keywordsFinite element methods
keywordsFracture (Materials) AND Cycles
treeJournal of Electronic Packaging:;1996:;volume( 118 ):;issue: 002
contenttypeFulltext


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