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contributor authorPeter A. Engel
contributor authorShou-Chien Chou
date accessioned2017-05-08T23:46:55Z
date available2017-05-08T23:46:55Z
date copyrightJune, 1995
date issued1995
identifier issn1528-9044
identifier otherJEPAE4-26149#136_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/115161
description abstractIn an earlier work [1], thermal stresses in soldered pins were calculated under the assumption of an elastically deforming solder barrel. In the present analysis, the nonlinear,temperature dependent stress-strain curve of solder, without creep, is taken into account, yielding an elasto-plastic foundation modulus function. For the thermal mismatch loading, the total temperature range ΔT (e.g., 0–100°C) is divided into a finite number n of temperature stages, and the final responses are superposed from the n contributions each of which done using an isothermal stress calculation. Three solders (Sn-Pb solders 63/37, 70/30, and 10/90), were investigated; the solder barrel thickness and mismatch temperature range were also variable parameters. Comparisons with elastic solder foundation calculation results show that thermal and inelastic solder stress/strain dependence should be included especially in the higher (over 75°C) temperature range.
publisherThe American Society of Mechanical Engineers (ASME)
titlePlastic Deformation of Solder Joints in Pin Grid Arrays Subjected to Thermal Stress
typeJournal Paper
journal volume117
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2792080
journal fristpage136
journal lastpage140
identifier eissn1043-7398
keywordsDeformation
keywordsThermal stresses
keywordsSolder joints
keywordsSolders
keywordsTemperature
keywordsStress
keywordsCreep
keywordsThickness
keywordsPins (Engineering) AND Stress-strain curves
treeJournal of Electronic Packaging:;1995:;volume( 117 ):;issue: 002
contenttypeFulltext


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