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contributor authorPeter A. Engel
contributor authorKee Rong Wu
date accessioned2017-05-08T23:38:06Z
date available2017-05-08T23:38:06Z
date copyrightSeptember, 1992
date issued1992
identifier issn1528-9044
identifier otherJEPAE4-26132#314_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110049
description abstractThe role of the solder joint as an elastic foundation is investigated first for structural analysis of the pin. Failure mechanisms are discussed. For various pin cross sections, guidelines for computing the foundation constant by analytical and finite element methods are established. Exact expression are derived for the pin stress. The solder stress (radial pressure or tension) is found by an approximate contact analysis. Elasto-plastic pin analysis, for excessive thermal mismatch, is effected by an iterative method. The variation of the plastic domain is examined for various size and material parameters. Axial forces in the presence and absence of pin plasticity are investigated, and the overall effect on the PGA is discussed.
publisherThe American Society of Mechanical Engineers (ASME)
titleThermal Stress Analysis of Pin Grid Array Structures: Pin and Solder Joint Problems
typeJournal Paper
journal volume114
journal issue3
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2905457
journal fristpage314
journal lastpage321
identifier eissn1043-7398
keywordsThermal stresses
keywordsSolder joints
keywordsStress
keywordsCross section (Physics)
keywordsTension
keywordsFinite element methods
keywordsFailure mechanisms
keywordsIterative methods
keywordsForce
keywordsPressure
keywordsPlasticity
keywordsStructural analysis AND Solders
treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 003
contenttypeFulltext


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