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contributor authorCynthia M. Melton
contributor authorCarl J. Raleigh
contributor authorSusan M. Yarling
date accessioned2017-05-08T23:38:05Z
date available2017-05-08T23:38:05Z
date copyrightDecember, 1992
date issued1992
identifier issn1528-9044
identifier otherJEPAE4-26133#476_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/110039
description abstractA quantitative dynamic solder wettability measurement technique was utilized to evaluate the effects of reflow processing on the wettability parameters associated with solder ball alloys. This technique enables the examination of the final degree of solder wetting and the continuous monitoring of wetting as a function of time during the reflow process under nitrogen atmosphere. An experimental design approach employing a 24 full factorial experiment was formulated to illustrate the use of this measurement technique investigating the final result of wetting. Solder wettability was determined with respect to the contact angle, base diameter and height of the reflowed solder ball alloy. The most significant effect estimates with respect to contact angle were solder flux and pad metallization. Solder ball alloy was found to significantly impact the base diameter and height of the reflowed solder. The effect of solder flux activators and pad metallizations on the subsequent continuous solder wettability wetting rates and amount of molten solder spread of solder ball alloys during reflow were measured. Reflow with a relatively more activated solder flux material was found to enhance the rate of solder wetting of the pad metallization.
publisherThe American Society of Mechanical Engineers (ASME)
titleQuantitative Solder Wetting Measurement for DCA Assembly
typeJournal Paper
journal volume114
journal issue4
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2905485
journal fristpage476
journal lastpage479
identifier eissn1043-7398
keywordsSolders
keywordsManufacturing
keywordsWetting (Surface science)
keywordsAlloys
keywordsExperimental design AND Nitrogen
treeJournal of Electronic Packaging:;1992:;volume( 114 ):;issue: 004
contenttypeFulltext


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