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contributor authorJ. K. Tien
contributor authorB. C. Hendrix
contributor authorA. I. Attarwala
date accessioned2017-05-08T23:35:18Z
date available2017-05-08T23:35:18Z
date copyrightJune, 1991
date issued1991
identifier issn1528-9044
identifier otherJEPAE4-26122#115_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/108394
description abstractFor lead/tin solders, room temperature is hot enough that deformation is controlled by creep. Creep deformation is thermally activated and is a function of time. Therefore, the appropriate parameters which can describe cyclic behavior are the ones which are functions of temperature and time, such as strain rates, ramp rates, and hold times. The traditional cyclic loading parameters of strain amplitude and stress amplitude are inadequate and can even be misleading as they do not take into consideration the rate at which strain or stress was applied. In addition to permanent creep strains, anelastic strains are also stored as a function of time during cyclic loading. Anelastic strains are recoverable and thus can be nondamaging. During cyclic loading, anelastic strains are stored along with creep strains during the time spent on load. If the hold times in accelerated cycling are shortened to the extent that a significant portion of the total strain stored during on-load is anelastic (around 3 seconds) then the damage storage rate decreases rather than accelerating. These factors need to be considered both when accelerated testing is contemplated and in the development of life prediction equations.
publisherThe American Society of Mechanical Engineers (ASME)
titleUnderstanding the Cyclic Mechanical Behavior of Lead/Tin Solder
typeJournal Paper
journal volume113
journal issue2
journal titleJournal of Electronic Packaging
identifier doi10.1115/1.2905376
journal fristpage115
journal lastpage120
identifier eissn1043-7398
keywordsSolders
keywordsMechanical behavior
keywordsStress
keywordsCreep
keywordsTemperature
keywordsTesting
keywordsEquations
keywordsFunctions
keywordsStorage AND Deformation
treeJournal of Electronic Packaging:;1991:;volume( 113 ):;issue: 002
contenttypeFulltext


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