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contributor authorM. J. Cohn
date accessioned2017-05-08T23:33:27Z
date available2017-05-08T23:33:27Z
date copyrightAugust, 1990
date issued1990
identifier issn0094-9930
identifier otherJPVTAS-28321#260_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/107394
description abstractFossil power plant high-energy piping systems operated at high temperatures are subject to creep damage, which is a time-dependent phenomenon. Traditional guidelines, such as the American Society of Mechanical Engineers (ASME) B31.1 Power Piping Code, were developed for plants having design lives in the 25–30 yr regime. Since many of these systems are being operated beyond 200,000 hr, it is important to reconsider the methodology of creep damage analysis to assure reliable long-term operation. Seven high-energy piping systems were evaluated in this study. The analysis of a minimum piping system life due to creep considered two approaches. The first approach used the traditional ASME B31.1 flexibility analysis guidelines. The second approach considered more detailed multiaxial stress state types of evaluations. The various equivalent stress methods used all six load components from the flexibility analysis. In nearly every case, the equivalent stress methods predicted significantly higher stresses. Consequently, the equivalent stress methodology results in 14 to 97 percent lower time to rupture values as compared to the values predicted using ASME B31.1 stresses.
publisherThe American Society of Mechanical Engineers (ASME)
titleRemaining Life of High-Energy Piping Systems Using Equivalent Stress
typeJournal Paper
journal volume112
journal issue3
journal titleJournal of Pressure Vessel Technology
identifier doi10.1115/1.2928623
journal fristpage260
journal lastpage265
identifier eissn1528-8978
keywordsStress
keywordsPiping systems
keywordsCreep
keywordsPlasticity
keywordsIndustrial plants
keywordsRupture
keywordsHigh temperature
keywordsPower Piping Code
keywordsASME
keywordsDesign AND Fossil fuels
treeJournal of Pressure Vessel Technology:;1990:;volume( 112 ):;issue: 003
contenttypeFulltext


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