Surface Microextensometry by Means of Moire Interferometry With a Scanning Electron Microscope
| contributor author | Marc-Henri Ambroise | |
| contributor author | T. Bretheau | |
| contributor author | P. Viaris de Lesegno | |
| date accessioned | 2017-05-08T23:24:22Z | |
| date available | 2017-05-08T23:24:22Z | |
| date copyright | March, 1987 | |
| date issued | 1987 | |
| identifier issn | 0021-8936 | |
| identifier other | JAMCAV-26277#237_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/102214 | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | Surface Microextensometry by Means of Moire Interferometry With a Scanning Electron Microscope | |
| type | Journal Paper | |
| journal volume | 54 | |
| journal issue | 1 | |
| journal title | Journal of Applied Mechanics | |
| identifier doi | 10.1115/1.3172970 | |
| journal fristpage | 237 | |
| journal lastpage | 239 | |
| identifier eissn | 1528-9036 | |
| keywords | Interferometry AND Scanning electron microscopes | |
| tree | Journal of Applied Mechanics:;1987:;volume( 054 ):;issue: 001 | |
| contenttype | Fulltext |
