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RISFew-Shot Classification of Wafer Bin Maps Using Transfer Learning and Ensemble Learning
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: The high cost of collecting and annotating wafer bin maps (WBMs) necessitates few-shot WBM classification, i.e., classifying WBM defect patterns using a limited number of WBMs. Existing few-shot WBM classification algorithms ...