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    Description and Evaluation of a Simplified Model to Simulate the Optical Behavior of an Angle-Resolved Scattered Light Sensor 

    Source: Journal of Computing and Information Science in Engineering:;2017:;volume( 017 ):;issue: 002:;page 21003
    Author(s): Torner, François M.; Stelzer, Gerhard; Anslinger, Lukas; Seewig, Jörg
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Scattered light sensors are optical sensors commonly used in industrial applications. They are particularly well suited to characterizing surface roughness. In contrast to most geometric measuring devices, a scattered light ...
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    Parameter Identification of an Abrasive Manufacturing Process With Machine Learning of Measured Surface Topography Information 

    Source: Journal of Computing and Information Science in Engineering:;2022:;volume( 022 ):;issue: 004:;page 41010-1
    Author(s): Schmidt, Samuel; Eifler, Matthias; Issel, Jan Cedric; de Payrebrune, Kristin M.; Ströer, Felix; Karatas, Abdullah; Seewig, Jörg
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The correlation between manufacturing parameters and the resulting surface topography is most often described with standardized profile surface texture parameters (R-parameters). However, in many cases, they represent a ...
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