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RISExploration of AFM Imaging Artifacts Occurring at Sharp Surface Features When Using Short Carbon Nanotube Probes and Possible Mitigation With Real-Time Force Spectroscopy
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: We present an overview of four types of imaging artifacts that can occur during characterization of sharp sample topographies with intermittent contact atomic force microscopy (AFM) when using ...
Utilizing Off-Resonance and Dual-Frequency Excitation to Distinguish Attractive and Repulsive Surface Forces in Atomic Force Microscopy
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A beam model is developed and discretized to study the dynamic behavior of the cantilever probe of an atomic force microscope. Atomic interaction force models are used with a multimode ...