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RISPrediction of Electromigration Critical Current Density in Passivated Arbitrary-Configuration Interconnect
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: A critical current density, a criterion of electromigration (EM) resistance in interconnects, above which EM damages initiate has been studied to minimize EM damages of interconnects. In general, the assessment of a critical ...
Prediction of Electromigration Critical Current Density in Passivated Arbitrary-Configuration Interconnect
Publisher: American Society of Mechanical Engineers (ASME)
Abstract: A critical current density, a criterion of electromigration (EM) resistance in interconnects, above which EM damages initiate has been studied to minimize EM damages of interconnects. In general, the assessment of a critical ...
Joule Heat Welding of Thin Platinum and Tungsten Wires and the Thermoelectric Effects Around Bi Metal Junctions
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: Fine thermoelectric elements were fabricated on electrode chips by welding together the tips of thin 5 خ¼m diameter Pt and W wires by Joule heat welding. The Pt/W junction was heated by bringing it into contact with a ...