Abstract: This paper presents an analytical model for predicting the variation in the pitch distance between pilot holes stamped with a progressive die. The model is useful in designing diesets since ...

Abstract: This work demonstrates the state of the art capabilities of three error separation techniques for nanometer-level measurement of precision spindles and rotationally-symmetric artifacts. Donaldson ...

Abstract: Capacitive displacement sensors are widely used in precision manufacturing and metrology because they measure displacements with nanometer resolution. Prior literature usually treats capacitive sensors ...