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    Cohesive Zone Modeling of the Polyimide/Silicon Interface in 2.5D Packaging by Nanoindentation Testing 

    Source: Journal of Electronic Packaging:;2026:;volume( 148 ):;issue:003:;page 1
    Author(s): Ren, Pan; Liu, Shaohui; Liang, Yaya; Liu, Cong; Du, Pingan
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Abstract. The polyimide (PI)/silicon (Si) is a critical interface in 2.5D packaging and is highly susceptible to failure due to thermal and mechanical loads. The large thermal expansion mismatch that exists between these ...
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