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    Observations in Changes of Electrical Properties in Thermally Neutron Exposed Boron Doped Silicon Semiconductors 

    Source: Journal of Nuclear Engineering and Radiation Science:;2015:;volume( 001 ):;issue: 003:;page 31009
    Author(s): Medina, Hector E.; Hinderliter, Brian
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Borondoped resistors and transistors were developed using various levels of boron concentration. These were exposed to a thermal neutron flux of about 2أ—108  s−1 cm−2 at various fluences, at Los Alamos National ...
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    Stress, Strain, and Energy at Fracture of Degraded Surfaces: Study of Replicates of Rough Surfaces 

    Source: Journal of Engineering for Gas Turbines and Power:;2014:;volume( 136 ):;issue: 003:;page 32502
    Author(s): Medina, Hector E.; Hinderliter, Brian
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: Due to the aging of structures, the issues of plant life management and license extension are receiving increasing emphasis in many countries. Understanding failure of structures due to random roughness on surfaces at early ...
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    Celebrating the 100th Anniversary of Inglis Result: From a Single Notch to Random Surface Stress Concentration Solutions 

    Source: Applied Mechanics Reviews:;2015:;volume( 067 ):;issue: 001:;page 10802
    Author(s): Medina, Hector E.; Pidaparti, Ramana; Hinderliter, Brian
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: We celebrate the first quantitative evidence for the stress concentration effect of flaws analyzed by Inglis. Stress concentration factor (SCF) studies have evolved ever since Inglis' 1913 result related to the problem of ...
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