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    Characterization of Lead-Free Solders in Flip Chip Joints 

    Source: Journal of Electronic Packaging:;2003:;volume( 125 ):;issue: 004:;page 531
    Author(s): S. Wiese; E. Meusel
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The creep and crack propagation behavior of SnAg3.5, SnAg4Cu0.5, and SnPb37 (as reference) was investigated on flip chip solder joints (V=1×10−12 m3). The test specimen consisted of two ...
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    The Effect of Underfill and Underfill Delamination on the Thermal Stress in Flip-Chip Solder Joints 

    Source: Journal of Electronic Packaging:;1998:;volume( 120 ):;issue: 004:;page 342
    Author(s): S. Rzepka; M. A. Korhonen; E. Meusel; C.-Y. Li
    Publisher: The American Society of Mechanical Engineers (ASME)
    Abstract: The stresses occurring in the solder joints during thermal loads have been studied by finite element analysis. Besides the cases of no underfill and perfect adhesion, underfill delaminations at ...
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