Search
Now showing items 1-1 of 1
Calibration Tools for Scanning Thermal Microscopy Probes Used in Temperature Measurement Mode
Publisher: American Society of Mechanical Engineers (ASME)
Abstract: We demonstrate the functionality of a new active thermal microchip dedicated to the temperature calibration of scanning thermal microscopy (SThM) probes. The silicon micromachined device consists in a suspended thin ...
CSV
RIS