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contributor authorA. Abdul-Latif
contributor authorM. Radi
date accessioned2017-05-09T00:38:00Z
date available2017-05-09T00:38:00Z
date copyrightJanuary, 2010
date issued2010
identifier issn0094-4289
identifier otherJEMTA8-27124#011008_1.pdf
identifier urihttp://yetl.yabesh.ir/yetl/handle/yetl/143372
description abstractBased on a well established nonincremental interaction law for fully anisotropic elastic-inelastic behavior of polycrystals, tangent formulation-based and simplified interaction laws of softened nature are derived to describe the nonlinear elastic-inelastic behavior of fcc polycrystals. Using the Eshelby’s tensor, the developed approach considers that the inclusion (grain) form is ellipsoidal. It has been clearly demonstrated by (2002, “Elastic-Inelastic Self-Consistent Model for Polycrystals,” ASME J. Appl. Mech., 69, pp. 309–316) for spherical inclusion that the tangent formulation-based model requires more calculation time, and is incapable to describe correctly the multiaxial elastic-inelastic behavior of polycrystals in comparison with the simplified model. Hence, the simplified nonincremental interaction is studied considering the grain shape effect. A parametric study is conducted showing principally the influence of the some important parameters (the grain shape (α) and the new viscous parameter γ) and the effect of their interaction on the hardening evolution of polycrystals. Quantitatively, it is recognized that the model describes suitably the grain shape effect together with the new viscous parameter γ on the strain-stress behavior of aluminum and Waspaloy under tensile test.
publisherThe American Society of Mechanical Engineers (ASME)
titleModeling of the Grain Shape Effect on the Elastic-Inelastic Behavior of Polycrystals With Self-Consistent Scheme
typeJournal Paper
journal volume132
journal issue1
journal titleJournal of Engineering Materials and Technology
identifier doi10.1115/1.3184036
journal fristpage11008
identifier eissn1528-8889
treeJournal of Engineering Materials and Technology:;2010:;volume( 132 ):;issue: 001
contenttypeFulltext


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