| contributor author | C. O. Ruud | |
| contributor author | R. N. Pangborn | |
| contributor author | P. S. DiMascio | |
| contributor author | D. J. Snoha | |
| date accessioned | 2017-05-08T23:21:01Z | |
| date available | 2017-05-08T23:21:01Z | |
| date copyright | May, 1985 | |
| date issued | 1985 | |
| identifier issn | 0094-9930 | |
| identifier other | JPVTAS-28256#185_1.pdf | |
| identifier uri | http://yetl.yabesh.ir/yetl/handle/yetl/100296 | |
| description abstract | A unique X-ray diffraction instrument for residual stress measurement has been developed that provides for speed, ease of measurement, accuracy, and economy of surface stress measurement. Application of this instrument with a material removal technique, e.g., electropolishing, has facilitated detailed, high resolution studies of three-dimensional stress fields. This paper describes the instrumentation and techniques applied to conduct the residual stress measurement and presents maps of the residual stress data obtained for the surfaces of a heavy 2 1/4 Cr 1 Mo steel plate weldment. | |
| publisher | The American Society of Mechanical Engineers (ASME) | |
| title | X-Ray Diffraction Measurement of Residual Stresses in Thick, Multi-Pass Steel Weldments | |
| type | Journal Paper | |
| journal volume | 107 | |
| journal issue | 2 | |
| journal title | Journal of Pressure Vessel Technology | |
| identifier doi | 10.1115/1.3264432 | |
| journal fristpage | 185 | |
| journal lastpage | 191 | |
| identifier eissn | 1528-8978 | |
| keywords | Steel | |
| keywords | X-ray diffraction | |
| keywords | Residual stresses | |
| keywords | Stress | |
| keywords | Instrumentation | |
| keywords | Electrolytic polishing | |
| keywords | Resolution (Optics) | |
| keywords | Accuracy and precision AND Economics | |
| tree | Journal of Pressure Vessel Technology:;1985:;volume( 107 ):;issue: 002 | |
| contenttype | Fulltext | |