Search
Now showing items 1-1 of 1
Electron-Phonon Interaction Model and Its Application to Thermal Transport Simulation During Electrostatic Discharge Event in NMOS Transistor
Publisher: The American Society of Mechanical Engineers (ASME)
Abstract: First, the electron-phonon interaction model, which has recently been developed by authors for thermal predictions within the silicon devices in micro/nanoscales, is verified through the comparison ...